The Trace Metal, Elemental & Microscopic Analysis area provides comprehensive analytical characterization support to CSIR IIP and external Organizations.
The facilities include:
- Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)
- Atomic Absorption Spectroscopy (AAS)
- Field Emission–Scanning Electron Microscopy (FE-SEM)
- Dedicated sample preparation instrument
Research & Development: The area contributes significantly to CSIR’s mission and vision, working in close collaboration with industry and academia to drive innovation and applied research.
